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    IC 測試服務 測試服務種類 測試環境 晶圓測試設備 產品測試設備
    1. Wafer Testers for DRAM
    Tester Advantest
    T5335P    		 Advantest
    T5372    		 Advantest
    T5581H
    Speed 30 MHz 143 MHz 250 MHz
    I/O, channel 144 640 576
    Driver, channel 480 1152 960
    Driver high voltage Yes Yes Yes
    AFM 288M*4/1G*2 8G*8 NA
    Flash option Yes/No Yes No
    MRA utility MRA2 MRA4ev2 NA
    DC unit (standard/max.) 16/16 32/32 32/32
    PPS unit (standard/max.) 32/32 128/128 64/64
    Duts/System (max.) 32 128 128
    Tester Advantest
    T5377    		 Advantest
    T5377S    		 Advantest
    T5593
    Speed 143 MHz 143 MHz 1066 MHz
    I/O, channel 1280 1280 768
    Driver, channel 2304 2304 768
    Driver high voltage Yes Yes Yes
    AFM 8G*16/16G*16 8G*8/16G*8/32G*8 NA
    Flash option Yes/No Yes/No No
    MRA utility MRA4ev2 MRA4ev2 NA
    DC unit (standard/max.) 64/64 128/128 32
    PPS unit (standard/max.) 256/256 256/256 160
    Duts/System (max.) 256 128 32
    2. Wafer Testers for Flash
    Tester Verigy V5400 Verigy V6000 Advantest T5830
    Flash type NAND / NOR NAND / NOR NAND / NOR
    Speed 50/100 MHz 280 MHz 400 MHz
    Site No 144 256 64
    Max Channel 4608 9216 9216
    PMU/site 4 1 12
    PPS/site 12 4 36
    OTA ± 1 ns ± 400 ps ± 350 ps
    Probe card interface ZIF Interposer ZIF
    Dut(Max) 1152 2304 2304
    3. Wafer Probers for Memory Test
    Prober TEL P-8 TEL P8-XL TEL P12-XL
    Wafer size 8" 8" 8”, 12"
    Contact Force 20 Kg 60 Kg 100 Kg
    Temperature range (standard) 50~150°C 50 ~ 150°C 50 ~ 150°C
    Temperature range (option) N/A -40 ~ 150°C -55 ~ 150°C
    Interface GPIB GPIB GPIB
    Prober TSK UF3000 TSK UF3000EX-e
    Wafer size 8", 12” 8”, 12"
    Contact Force 100 Kg 100 Kg
    Temperature range (standard) 25 ~ 150°C 25 ~ 150°C
    Temperature range (option) -55 ~ 150°C -55 ~ 150°C
    Interface GPIB GPIB
    4. Support Systems for Memory Test
    Applications Vendor Model
    Probe Card Analyzer 4500c/h API PRVX-3
    10000c/h API Probe WoRx
    Wafer Inspection 8" Nikon MWL860+L200
    12" Nikon OST3100
    8”/12” Leica INS 300
    8”/12” Camtek Falcon 830
    8”/12” Camtek Condor
    Laser Repair 8"/12" ESI ESI-9820
    12" ESI ESI-9850TPIR
    UV 8”/12” manual tray Jelight 2442
    Oven Max. 350℃ C-SUN MOL-3S/HMOL-4S
    Max. 350℃ Despatch LCD2
    Max. 350℃ Shiny CLO-A7-T2NC
    5. Wafer Testers for Display Driver IC (DDIC)
    Tester Advantest T6371 Advantest T6372 Advantest T6373 Advantest T6391
    Speed 125MHz 125 MHz 125 MHz 500 MHz
    I/O, channel 256 256 256 512 / 1024
    Driver, channel 1280 1536 2304 2304 / 3584
    PPS unit (max.) 16 16 32 48 / 160
    DC unit (max.) 64 128 160 128
    Duts/System(max.) 4 4 32 32
    Tester Yokogawa TS670 Yokogawa TS6730 Diamond X Teradyne J750
    Speed 80 MHz 250 MHz 200 MHz 800 MHz
    I/O, channel  112 64 x 2 (NSIO)
    32 (HSIO)
    14 pairs (DIHD)    		  768  1024
    Driver, channel 512 1334 2560 2416
    PPS unit (max.) 4 8 120 24
    DC unit (max.) 24 72 72 64
    Duts/System (max.) 2 4 36 32
    6. Wafer Probers for Display Driver IC (DDIC)
    Prober TSK UF200A TSK UF3000 TSK UF3000EX-e
    Wafer size 8" 8”, 12" 8”, 12"
    Contact Force 60 Kg 100 Kg 100 Kg
    Temperature range (standard) 50~150°C 25 ~ 150°C 25 ~ 150°C
    Temperature range (option) N/A -55 ~ 150°C -55 ~ 150°C
    Interface GPIB GPIB GPIB
    7. Support Systems for Display Driver IC (DDIC)
    Applications Vendor Model
    Probe Card Analyzer 4500c/h API PRVX-3
    4500c/h API PRVX-4
    Wafer Inspection 12" Nikon OST3000
    UV 6"/8" manual tray Spectronics PC-8820B
    8"/12" manual tray Jelight 2442
    Oven Max. 300℃ C-SUN MOL-2
    Max. 300℃ C-SUN MOL-3
    Inker Machine 8" TSK UF200A
    12" TSK UF3000
    12" TSK UF3000EX-e
    8. Wafer Testers for Mixed-Signal IC
    Tester HP/Verigy HP93000-C400e Advantest/Verigy  PS400 Advantest PS1600 LTX -Credence D10
    Base Freq. 100 MHz 400 MHz 400 MHz 100 MHz
    Data Rate 400 Mbps 533 Mbps 1600 Mbps 200 Mbps
    Test Head 1(LTH) 1(CTH) 1(CTH) 1
    Digital Board C400E/P1000 PS400 PS1600 DPIN96
    Digital Pin Count 512~896 Pins 384~512 Pins 512~1024 Pins 480~768 Pins
    Vector Memory 28M/56M/112M 16M/32M 16M/32M/64M 16M/32M
    DPS Power GPDPS / MSDPS MSDPS / DPS32 DPS32 / DPS64 DPS16 / VIS16
    Analog Module WGA : 1M AWG
    WGB : 128M AWG
    WDA : 40M DIG
    WDB : 2M DIG
    AV8 : MCA
    TIA : Wavecrast

     

    		 AV8 : MCA/MCB AV8 : MCB/MCE MultiWave
    9. Wafer Probers for Mixed-Signal IC
    Prober SEMICS OPUS-II TSK UF200 TSK UF3000 series
    Wafer Size 8", 12" 8" 8", 12"
    Temperature Range 25℃ ~ 150℃ 25℃ ~ 150℃ 25℃ ~ 150℃
    Interface GPIB GPIB GPIB
    Frame Prober PlumFive PCP-101
    Frame Size 8" frame
    Temperature Range 25℃
    Interface GPIB